Title :
Charge-collection and single-event upset measurements at the ISIS neutron source
Author :
Platt, S.P. ; Torok, Z. ; Frost, C.D. ; Ansell, S.
Author_Institution :
Sch. of Comput., Univ. of Central Lancashire, Preston, UK
Abstract :
Charge-collection measurements at the VESUVIO instrument at ISIS are described. Neutron SEU cross-sections in SRAM-based FPGAs are measured. Results are compared to equivalent data from Los Alamos Neutron Science Center.
Keywords :
field programmable gate arrays; neutron sources; ISIS neutron source; SRAM-based FPGA; VESUVIO instrument; charge-collection measurements; neutron SEU cross-sections; single-event upset measurements; Charge measurement; Current measurement; Field programmable gate arrays; Instruments; Intersymbol interference; Neutrons; Pixel; Protons; Rails; Single event upset;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205540
