Title :
Comprehensive SEE characterization of 0.13µm flash-based FPGAs by heavy ion beam test
Author :
Rezgui, Sana ; Wang, J.J. ; Tung, Eric Chan ; Cronquist, Brian ; McCollum, John
Author_Institution :
Actel Corp., Mountain View, CA, USA
Abstract :
Heavy-ion test results utilizing novel test methodologies of reprogrammable and non-volatile flash-based FPGAs are presented and discussed. The 5 programmable architectures in the A3P FPGA-family were tested: I/O structures, FPGA Core, PLL, FROM and SRAM.
Keywords :
SRAM chips; computer peripheral equipment; field programmable gate arrays; flash memories; ion beam effects; phase locked loops; A3P FPGA-family; FPGA core; I-O structure; PLL; PROM; SRAM; comprehensive SEE characterization; heavy ion beam test; reprogrammable nonvolatile flash-based FPGA; single event effect; CMOS logic circuits; Circuit testing; Field programmable gate arrays; Ion beams; Logic programming; Nonvolatile memory; Phase locked loops; Random access memory; Switches; Tiles; PLL; SEE Characterization and Mitigation; SRAM; radiation testing; reprogrammable and non-volatile FPGAs;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205551
