Title :
The experience of starting-up a radiation test at the 18MeV cyclotron in the Spanish National Accelerators Center
Author :
Tombs, Jonathan ; Aguirre, Miguel A. ; Palomo, Rogelio ; Mogollón, Juan M. ; Guzmán, Hipolito ; Nápoles, Javier ; Rodríguez-Pérez, Alberto ; Rodríguez, José A. ; Vega-Leal, Alfredo P. ; Morillas, Yolanda ; García, Javier
Author_Institution :
Dto. Ing. Electron., Univ. de Sevilla, Sevilla, Spain
Abstract :
Space application integrated circuits have large and complex validation process. One of the most expensive stage is the radiation test. There are few facilities qualified to satisfy the requirements of standards. Low power accelerators are used to simplify the validation process, because they usually have beam time, lower costs, and flexibility to access. As prevalidation tools they can provide valuable information about the circuit behavior. In this paper the first experience of irradiation to a silicon device during its execution in the Spanish National Accelerator Center is described. A radiation test using a semi-custom programmable (CPLD) commercial technology has been set-up. During this experience the CPLD has been irradiated with protons at 18 MeV while the device was running with a custom design. Results obtained are described and the damage over the device has been understood as total ionization dose.
Keywords :
cyclotrons; elemental semiconductors; integrated circuit testing; proton effects; semiconductor device testing; silicon; Si; Spanish National Accelerators Center; cyclotron; electron volt energy 18 MeV; ionization dose; power accelerators; proton irradiation; radiation test; semicustom programmable commercial technology; silicon device; space application integrated circuits; Application specific integrated circuits; Circuit testing; Costs; Cyclotrons; Electronic circuits; Ion accelerators; Ionization; Life estimation; Particle beams; Proton accelerators;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205552