DocumentCode :
2982055
Title :
Degradation of capacitor-based isolation amplifiers under neutron and gamma radiation
Author :
Franco, F.J. ; Zong, Y. ; Agapito, J.A.
Author_Institution :
Dept. of Fis. Aplic. III, Univ. Complutense de Madrid, Madrid, Spain
fYear :
2007
fDate :
10-14 Sept. 2007
Firstpage :
1
Lastpage :
7
Abstract :
Some samples of the ISO122 and the ISO124, capacitor-based isolation amplifiers from Texas Instruments, were irradiated in a neutron & gamma environment in order to investigate their tolerance to the total radiation dose. After the experimental data, the most sensitive parameters were the offset voltages, transmission gain and the typical output error. In any case, devices are still operative after receiving 2.2middot1013 1-MeV nmiddotcm-2 & 235 Gy(Si).
Keywords :
amplifiers; capacitors; ISO122; ISO124; Texas Instruments; capacitor-based isolation amplifier; gamma radiation; total radiation dose; Capacitors; Degradation; Gamma rays; Instruments; Neutrons; Operational amplifiers; Optical amplifiers; Pulse amplifiers; Pulse width modulation; Voltage; Accumulated radiation damage; isolation amplifiers; neutron damage; operational amplifiers; pulse-width modulation (PWM); total ionising dose;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
ISSN :
0379-6566
Print_ISBN :
978-1-4244-1704-9
Type :
conf
DOI :
10.1109/RADECS.2007.5205558
Filename :
5205558
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2982055
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