Compendium of TID and SEL test results for various candidate spacecraft electronics

Author

Malou, Florance ; Dangla, David ; Bezerra, Francoise ; Garnier, Jean ; Sifflet, Sébastien ; Falo, William ; Pascal, Jean-François

Author_Institution

CNES, Toulouse, France

fYear

2007

fDate

10-14 Sept. 2007

Firstpage

1

Lastpage

8

Abstract

We present data on the vulnerability of various candidate spacecraft electronics to total ionizing dose and heavy ion induced single event latch up. Most of the tested devices are commercial integrated circuits, including Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), Amplifiers, Power management products and others.

Keywords

amplifiers; analogue-digital conversion; digital-analogue conversion; integrated circuit testing; ion beam effects; low-power electronics; space vehicle electronics; ADC; DAC; SEL test; TID test; amplifiers; analog-to-digital converters; commercial integrated circuits; digital-to-analog converters; heavy ion induced single event latch up; power management products; spacecraft electronics; total ionizing dose; Aerospace electronics; Analog integrated circuits; Analog-digital conversion; Circuit testing; Digital integrated circuits; Digital-analog conversion; Electronic equipment testing; Integrated circuit testing; Latches; Space vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on

Conference_Location

Deauville

ISSN

0379-6566

Print_ISBN

978-1-4244-1704-9

Type

conf

DOI

10.1109/RADECS.2007.5205560

Filename

5205560