Title :
Compendium of TID and SEL test results for various candidate spacecraft electronics
Author :
Malou, Florance ; Dangla, David ; Bezerra, Francoise ; Garnier, Jean ; Sifflet, Sébastien ; Falo, William ; Pascal, Jean-François
Author_Institution :
CNES, Toulouse, France
Abstract :
We present data on the vulnerability of various candidate spacecraft electronics to total ionizing dose and heavy ion induced single event latch up. Most of the tested devices are commercial integrated circuits, including Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), Amplifiers, Power management products and others.
Keywords :
amplifiers; analogue-digital conversion; digital-analogue conversion; integrated circuit testing; ion beam effects; low-power electronics; space vehicle electronics; ADC; DAC; SEL test; TID test; amplifiers; analog-to-digital converters; commercial integrated circuits; digital-to-analog converters; heavy ion induced single event latch up; power management products; spacecraft electronics; total ionizing dose; Aerospace electronics; Analog integrated circuits; Analog-digital conversion; Circuit testing; Digital integrated circuits; Digital-analog conversion; Electronic equipment testing; Integrated circuit testing; Latches; Space vehicles;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location :
Deauville
Print_ISBN :
978-1-4244-1704-9
DOI :
10.1109/RADECS.2007.5205560
