Title :
Dual processor VHSIC MIL-STD-1750 A computer module
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
The design of a MIL-STD-1750 A computer implemented on a SEM-E size module is described. The module features a unique multi-processor architecture with two 1750 A-compatible processors and two intelligent PI-bus interface devices sharing a common on-board memory. The module implements the 1750 A memory mapping scheme, includes circuitry for processor control during software debug, and circuitry for built-in-test. The module has external interfaces for a dual PI-bus, a dual TM-bus, an IEEE-488 bus, discretes, and interrupts. Several novel technologies have come together in order to implement all of these features on single-width SEM-E size module. First, VHSIC-class technology was utilized to develop seven complex ICs in submicrometer CMOS to implement the primary functions. Next, fine-pitch leadless ceramic chip carrier packages were developed to reduce the size of the high pinout devices. Finally, advanced, high density, surface mount compatible, board technology was required for enhanced solder-joint reliability
Keywords :
CMOS integrated circuits; VLSI; digital integrated circuits; microcomputers; microprocessor chips; modules; multiprocessing systems; surface mount technology; 1750 A-compatible processors; BIST; CMOS; IEEE-488 bus; MIL-STD-1750 A computer; SMT; VHSIC-class technology; VLSI; built in self test circuitry; built-in-test; circuitry for processor control; common on-board memory; computer architecture; dual PI-bus; dual TM-bus; dual processor computer module; external interfaces; features; fine-pitch leadless ceramic chip carrier packages; high density; high pinout devices; intelligent PI-bus interface devices; interrupts; memory mapping scheme; multi-processor architecture; single-width SEM-E size module; software debug; solder-joint reliability; submicrometer; surface mount compatible; Circuit faults; Embedded software; Logic devices; Logic gates; Nonvolatile memory; Printed circuits; Protection; Software debugging; Software testing; Very high speed integrated circuits;
Conference_Titel :
Aerospace and Electronics Conference, 1988. NAECON 1988., Proceedings of the IEEE 1988 National
Conference_Location :
Dayton, OH
DOI :
10.1109/NAECON.1988.194994