DocumentCode
2982343
Title
Total dose effects in op-amps with compensated input stages
Author
Johnston, A.H. ; Rax, B.G. ; Thorbourn, D.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fYear
2007
fDate
10-14 Sept. 2007
Firstpage
1
Lastpage
8
Abstract
This paper discusses total dose damage in operational amplifiers with compensated input stages. The impact of this design approach on unit-to-unit variability of radiation damage is examined, along with hardness assurance methods that can be used to bound the radiation behavior. Data is included for an unusually large sample (100 devices) of one device type. Half of those devices were subjected to burn-in before irradiation to investigate the effect of burn-in on radiation response.
Keywords
operational amplifiers; radiation effects; compensated input stages; hardness assurance methods; operational amplifier; radiation damage; radiation response; total dose damage; unit-to-unit variability; Circuits; Degradation; Impedance matching; Ionization; Low voltage; Mirrors; Operational amplifiers; Propulsion; Radiation effects; Space technology; hardness assurance; operational amplifier; space radiation effects; total dose;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Conference_Location
Deauville
ISSN
0379-6566
Print_ISBN
978-1-4244-1704-9
Type
conf
DOI
10.1109/RADECS.2007.5205570
Filename
5205570
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