• DocumentCode
    2982449
  • Title

    Modeling of downlink wireless fading channel for 3GPP LTE cellular system

  • Author

    Sallabi, Farag ; Shuaib, Khaled

  • Author_Institution
    Fac. of Inf. Technol., United Arab Emirates Univ., Al Ain, United Arab Emirates
  • fYear
    2011
  • fDate
    19-22 Feb. 2011
  • Firstpage
    421
  • Lastpage
    424
  • Abstract
    In this paper, we model the behavior of a finite-state downlink wireless fading channel based on the configurations and system parameters provided by the 3GPP LTE. By partitioning the range of the received signal-to-noise ratio into a finite number of intervals, finite-state Markov channel models can be constructed for Rayleigh fading channels. Each state corresponds to a different channel quality indicated by certain modulation scheme. In LTE, Node B is capable of transmitting frames in the downlink with different modulation schemes (QPSK, 16QAM, 64QAM). The model can be used to provide realistic physical layer input to evaluate the performance of algorithms at the upper layers. For example, the MAC layer will use this data to test the performance of scheduling, admission control, power control, etc. Computer simulations are performed to verify the accuracy of the proposed model.
  • Keywords
    3G mobile communication; Markov processes; Rayleigh channels; cellular radio; quadrature amplitude modulation; quadrature phase shift keying; 16QAM; 3GPP LTE cellular system; 64QAM; MAC layer; Node B; QPSK; Rayleigh fading channels; channel quality; computer simulations; finite state downlink wireless fading channel modelling; finite-state Markov channel models; modulation schemes; physical layer; signal-to-noise ratio; Bandwidth; Bit rate; Fading; Markov processes; Modulation; Signal to noise ratio; Wireless communication; Channel Quality; LTE; Modeling; Modulation Scheme;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    GCC Conference and Exhibition (GCC), 2011 IEEE
  • Conference_Location
    Dubai
  • Print_ISBN
    978-1-61284-118-2
  • Type

    conf

  • DOI
    10.1109/IEEEGCC.2011.5752571
  • Filename
    5752571