Traditional methods shortfall in predicting modern microelectronics behavior in space

Technology scaling in modern day microelectronics has introduced characteristics and limitations that impacted radiation testing and modeling to the point that rendered traditional methods and practices obsolete in many cases. There is a need to rethink test methodologies, procedures and models in order to predict the true behavior of these technologies in space. In this paper we hope to highlight some of our experiences in order to encourage the development of improved test and prediction methodologies as they apply to modern microelectronics.