• DocumentCode
    2982582
  • Title

    BTBT Transistor Scaling: Can they be Competitive with MOSFETs?

  • Author

    Woo, Raymond ; Koh, H. Y Serene ; Onal, Caner ; Griffin, P.B. ; Plummer, James D.

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., Stanford, CA
  • fYear
    2008
  • fDate
    23-25 June 2008
  • Firstpage
    75
  • Lastpage
    76
  • Abstract
    The authors analysis shows the significant challenges facing the development of TFETs. Our simulation results show that it is unlikely that Si TFETs will be able to achieve the necessary ON-current to compete with MOSFETs. The exponential drain characteristic is a problem fundamental to TFET structures demonstrated so far. Overcoming this problem will require device improvements and more efficient tunneling materials to achieve higher ON-currents. It may also be possible to engineer novel BTBT based devices without exponential drain voltage characteristics, but doing so while also achieving steeper than ´kT/q´ subthreshold slope will be difficult.
  • Keywords
    MOSFET; scaling circuits; BTBT transistor scaling; MOSFET; TFET structures; band-to-band tunneling; exponential drain voltage; tunneling materials; CMOS technology; Capacitance; Circuit simulation; Dielectrics; Immune system; Logic circuits; MOSFETs; Prototypes; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2008
  • Conference_Location
    Santa Barbara, CA
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4244-1942-5
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2008.4800741
  • Filename
    4800741