DocumentCode
2982582
Title
BTBT Transistor Scaling: Can they be Competitive with MOSFETs?
Author
Woo, Raymond ; Koh, H. Y Serene ; Onal, Caner ; Griffin, P.B. ; Plummer, James D.
Author_Institution
Center for Integrated Syst., Stanford Univ., Stanford, CA
fYear
2008
fDate
23-25 June 2008
Firstpage
75
Lastpage
76
Abstract
The authors analysis shows the significant challenges facing the development of TFETs. Our simulation results show that it is unlikely that Si TFETs will be able to achieve the necessary ON-current to compete with MOSFETs. The exponential drain characteristic is a problem fundamental to TFET structures demonstrated so far. Overcoming this problem will require device improvements and more efficient tunneling materials to achieve higher ON-currents. It may also be possible to engineer novel BTBT based devices without exponential drain voltage characteristics, but doing so while also achieving steeper than ´kT/q´ subthreshold slope will be difficult.
Keywords
MOSFET; scaling circuits; BTBT transistor scaling; MOSFET; TFET structures; band-to-band tunneling; exponential drain voltage; tunneling materials; CMOS technology; Capacitance; Circuit simulation; Dielectrics; Immune system; Logic circuits; MOSFETs; Prototypes; Tunneling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 2008
Conference_Location
Santa Barbara, CA
ISSN
1548-3770
Print_ISBN
978-1-4244-1942-5
Electronic_ISBN
1548-3770
Type
conf
DOI
10.1109/DRC.2008.4800741
Filename
4800741
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