DocumentCode :
2982745
Title :
A Novel and Robust Un-Assisted, Low-Trigger and High-Holding Voltage SCR (uSCR) for Area-Efficient On-Chip ESD Protection
Author :
Lou, Lifang ; Liou, Juin J.
Author_Institution :
Univ. of Central Florida, Orlando
fYear :
2007
fDate :
20-22 Dec. 2007
Firstpage :
605
Lastpage :
607
Abstract :
A novel and robust un-assisted low-trigger and high-holding voltage silicon controlled rectifier (uSCR) is proposed and realized in a 0.35-mum fully-salicided BiCMOS process. Without using any external trigger circuitry, the uSCR has a trigger voltage as low as 7 V to effectively protect deep submicron MOS circuits and a holding voltage higher than the supply voltage to minimize transient influence and avoid latch-up issue. Moreover, the electrostatic discharge (ESD) protection robustness of the uSCR in both positive and negative operations exceeds 60 mA/mum, which enables ESD protection levels of 8 kV human body model (HBM) and 2 kV charged device model (CDM) for a low voltage ICs, while each uSCR cell only consumes an area of about 2400 mum2.
Keywords :
BiCMOS integrated circuits; electrostatic discharge; thyristors; BiCMOS process; charged device model; electrostatic discharge protection; size 0.35 mum; transient influence; voltage 2 kV; voltage 8 kV; voltage silicon controlled rectifier; Biological system modeling; Breakdown voltage; Circuits; Electrostatic discharge; Humans; Low voltage; Protection; Robust control; Robustness; Thyristors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2007. EDSSC 2007. IEEE Conference on
Conference_Location :
Tainan
Print_ISBN :
978-1-4244-0637-1
Electronic_ISBN :
978-1-4244-0637-1
Type :
conf
DOI :
10.1109/EDSSC.2007.4450197
Filename :
4450197
Link To Document :
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