• DocumentCode
    2982745
  • Title

    A Novel and Robust Un-Assisted, Low-Trigger and High-Holding Voltage SCR (uSCR) for Area-Efficient On-Chip ESD Protection

  • Author

    Lou, Lifang ; Liou, Juin J.

  • Author_Institution
    Univ. of Central Florida, Orlando
  • fYear
    2007
  • fDate
    20-22 Dec. 2007
  • Firstpage
    605
  • Lastpage
    607
  • Abstract
    A novel and robust un-assisted low-trigger and high-holding voltage silicon controlled rectifier (uSCR) is proposed and realized in a 0.35-mum fully-salicided BiCMOS process. Without using any external trigger circuitry, the uSCR has a trigger voltage as low as 7 V to effectively protect deep submicron MOS circuits and a holding voltage higher than the supply voltage to minimize transient influence and avoid latch-up issue. Moreover, the electrostatic discharge (ESD) protection robustness of the uSCR in both positive and negative operations exceeds 60 mA/mum, which enables ESD protection levels of 8 kV human body model (HBM) and 2 kV charged device model (CDM) for a low voltage ICs, while each uSCR cell only consumes an area of about 2400 mum2.
  • Keywords
    BiCMOS integrated circuits; electrostatic discharge; thyristors; BiCMOS process; charged device model; electrostatic discharge protection; size 0.35 mum; transient influence; voltage 2 kV; voltage 8 kV; voltage silicon controlled rectifier; Biological system modeling; Breakdown voltage; Circuits; Electrostatic discharge; Humans; Low voltage; Protection; Robust control; Robustness; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2007. EDSSC 2007. IEEE Conference on
  • Conference_Location
    Tainan
  • Print_ISBN
    978-1-4244-0637-1
  • Electronic_ISBN
    978-1-4244-0637-1
  • Type

    conf

  • DOI
    10.1109/EDSSC.2007.4450197
  • Filename
    4450197