Title :
New basis orthonormalization procedure of the linear non-uniform spline scaling and wavelet spaces
Author_Institution :
L2TI, Univ. Paris, Villetaneuse
Abstract :
This paper investigates the mathematical framework of multiresolution analysis under the assumption that the sequence knots are irregularly spaced. The study is based on the construction of nested non-uniform linear spline multiresolution spaces. We focus on the construction of suitable linear orthonormal spline scaling and wavelet bases. If no more additional conditions than multiresolution ones are imposed, the orthonormal basis of the linear spline space is represented by two discontinuous scaling functions. Therefore, the linear spline wavelet basis, closely related to the scaling basis, is defined by a set of two discontinuous wavelet functions. In addition, the orthogonal decomposition is implemented using filter banks where the coefficients depend on the location of the knots on the sequence. The main objective of this paper is to show that a judicious orthonormalization procedure of the basic linear spline space basis allows to (i) satisfying the continuity conditions of the scaling and wavelet functions, (ii) reducing the number of the wavelet functions to only one function (iii) reducing the complexity of the filter bank
Keywords :
channel bank filters; signal resolution; splines (mathematics); wavelet transforms; basis orthonormalization procedure; discontinuous scaling functions; discontinuous wavelet functions; filter banks; linear nonuniform spline scaling; linear orthonormal spline scaling; linear spline wavelet basis; multiresolution analysis; nested nonuniform linear spline multiresolution spaces; sequence knots; wavelet spaces; Filter bank; Information technology; Interpolation; Multiresolution analysis; Polynomials; Signal processing; Signal resolution; Space technology; Spline; Wavelet analysis; Interpolation; non-uniform B-spline; scaling function; wavelet function;
Conference_Titel :
Signal Processing and Information Technology, 2006 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-9753-3
Electronic_ISBN :
0-7803-9754-1
DOI :
10.1109/ISSPIT.2006.270787