Title :
Proceedings of the 2004 IEEE International Frequency Control Symposium And Exhibition (IEEE Cat. No.04CH37553C)
Abstract :
The following topics are dealt with: FBAR thin film resonators; piezoelectric materials; cold atom clocks; miniature atomic clocks; manufacturing technology; enhancing microwave standard performance; jitter, and miniature oscillators; optical standards and applications; chemical sensors; microwave oscillators; physical sensors; microwave and MEMS resonators - theory and fabrication; phase noise measurement and reduction techniques; sensor technology and instrumentation; timescales and time transfer; frequency shifts in crystal resonators; oscillators and resonators; resonator analysis and mode imaging; crystal resonators; frequency standards; oscillators, synthesizers and noise.
Keywords :
atomic clocks; bulk acoustic wave devices; chemical sensors; circuit noise; crystal resonators; frequency standards; frequency synthesizers; measurement standards; micromechanical resonators; microwave oscillators; phase noise; piezoelectric materials; thin film devices; transfer standards; FBAR; MEMS resonators; chemical sensors; cold atom clocks; crystal resonator frequency shift; crystal resonators; frequency standards; instrumentation; manufacturing technology; microwave oscillators; microwave resonators; microwave standards; miniature atomic clocks; optical standards; oscillator noise; phase noise measurement; phase noise reduction; resonator analysis; resonator mode imaging; single crystal piezoelectric materials; synthesizer noise; thin film resonators; time transfer; timescales;
Conference_Titel :
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
Conference_Location :
Montreal, Quebec, Canada
Print_ISBN :
0-7803-8414-8
DOI :
10.1109/FREQ.2004.1418406
