DocumentCode :
2983086
Title :
A study of wafer fab dispatching rules based on empirical flow time predictions
Author :
Hung, Yi-Feng ; Chang, Ching-Bin
Author_Institution :
Dept. of Ind. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
1997
fDate :
13-15 Oct 1997
Firstpage :
430
Lastpage :
438
Abstract :
This study examined two dispatch rules-modified least slack rule and shortest remaining flow time rule. Both of these rules require future flow time prediction. We experimented with two flow time prediction methods-an exponential smoothing method and an iterative empirical curve approach. These new rules were compared with some other commonly used rules by simulation experiment. For the performance measure of mean flow time, the shortest remaining processing time rule performed best. Whereas, for the performance measure of standard deviation of flow time, the modified least slack rule with the flow time prediction by the iterative empirical curve approach performed best
Keywords :
digital simulation; integrated circuit manufacture; iterative methods; production control; queueing theory; semiconductor process modelling; stock control; empirical flow time predictions; exponential smoothing method; future flow time prediction; iterative empirical curve approach; mean flow time; modified least slack rule; shortest remaining flow time rule; standard deviation; wafer fab dispatching rules; Dispatching; Electronics industry; Fabrication; Fluid flow measurement; Iterative methods; Job shop scheduling; Performance evaluation; Production; Queueing analysis; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1997., Twenty-First IEEE/CPMT International
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-3929-0
Type :
conf
DOI :
10.1109/IEMT.1997.626957
Filename :
626957
Link To Document :
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