DocumentCode
2983220
Title
Spotting Culprits in Epidemics: How Many and Which Ones?
Author
Prakash, B. Aditya ; Vreeken, Jilles ; Faloutsos, Christos
Author_Institution
Comput. Sci. Dept., Virginia Tech., Blacksburg, VA, USA
fYear
2012
fDate
10-13 Dec. 2012
Firstpage
11
Lastpage
20
Abstract
Given a snapshot of a large graph, in which an infection has been spreading for some time, can we identify those nodes from which the infection started to spread? In other words, can we reliably tell who the culprits are? In this paper we answer this question affirmatively, and give an efficient method called NETSLEUTH for the well-known Susceptible-Infected virus propagation model. Essentially, we are after that set of seed nodes that best explain the given snapshot. We propose to employ the Minimum Description Length principle to identify the best set of seed nodes and virus propagation ripple, as the one by which we can most succinctly describe the infected graph. We give an highly efficient algorithm to identify likely sets of seed nodes given a snapshot. Then, given these seed nodes, we show we can optimize the virus propagation ripple in a principled way by maximizing likelihood. With all three combined, NETSLEUTH can automatically identify the correct number of seed nodes, as well as which nodes are the culprits. Experimentation on our method shows high accuracy in the detection of seed nodes, in addition to the correct automatic identification of their number. Moreover, we show NETSLEUTH scales linearly in the number of nodes of the graph.
Keywords
epidemics; graph theory; microorganisms; NETSLEUTH; culprit spotting; epidemics; graph snapshot; infected graph; infection; minimum description length principle; seed nodes; susceptible-infected virus propagation model; virus propagation ripple; Data models; Encoding; Equations; Integrated circuit modeling; Nickel; Reliability; Silicon; culprits; diffusion; epidemics; seeds;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining (ICDM), 2012 IEEE 12th International Conference on
Conference_Location
Brussels
ISSN
1550-4786
Print_ISBN
978-1-4673-4649-8
Type
conf
DOI
10.1109/ICDM.2012.136
Filename
6413787
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