DocumentCode :
2983303
Title :
High-Speed, Low-Temperature Integrated ZnO/Organic CMOS Circuits
Author :
Mourey, Devin A. ; Park, Sung Kyu ; Zhao, Dalong ; Sun, Jie ; Li, Yuanyuan ; Subramanian, Sankar ; Nelson, Shelby F. ; Levy, David H. ; Anthony, John E. ; Jackson, Thomas N.
Author_Institution :
Dept. of Mater. Sci. Eng., Penn State Univ., University Park, PA
fYear :
2008
fDate :
23-25 June 2008
Firstpage :
147
Lastpage :
148
Abstract :
The demand for low-cost, high mobility, thin-film technologies has generated particular interest in low-temperature- processed organic and metal oxide semiconductors. In addition, the development of CMOS circuits is likely to be important for low-power and battery-driven technologies. We have focused on ZnO, one of the most promising n- type semiconductors for thin-film application, but to date the formation of stable, high-mobility p-type at low temperatures has been challenging. We have previously demonstrated that by using a low-temperature (200degC) atmospheric pressure spatial ALD process, we can deposit uniform A1203 and ZnO films that result in high-mobility transistors (>15 cm2/V-s) and fast ring oscillators (<50 ns/stage). We have also demonstrated simple circuits using the high-mobility, solution-deposited, p-type organic semiconductor difluoro 5,ll-bis(triethylsilylethynyl) anthradithiophene (diF TES-ADT). We now report an integrated approach that combines these two technologies in a simple way to form low-temperature CMOS circuits.
Keywords :
CMOS integrated circuits; II-VI semiconductors; organic semiconductors; oscillators; thin film circuits; transistor circuits; wide band gap semiconductors; zinc compounds; ZnO; high-mobility transistors; integrated CMOS circuits; metal oxide semiconductors; n-type semiconductors; organic semiconductors; ring oscillators; thin-film technologies; CMOS technology; Chemical technology; Circuit testing; Electrodes; Gold; Organic semiconductors; Semiconductor thin films; Sun; Thin film circuits; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 2008
Conference_Location :
Santa Barbara, CA
ISSN :
1548-3770
Print_ISBN :
978-1-4244-1942-5
Electronic_ISBN :
1548-3770
Type :
conf
DOI :
10.1109/DRC.2008.4800777
Filename :
4800777
Link To Document :
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