• DocumentCode
    298332
  • Title

    Measuring delay time in adders using circuit simulation

  • Author

    Hsu, Yuang Ming ; Swartzlander, Earl E., Jr.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • Volume
    1
  • fYear
    1994
  • fDate
    3-5 Aug 1994
  • Firstpage
    265
  • Abstract
    In designing digital VLSI circuits, it is important to determine before fabrication the maximum speed at which the circuits can operate. Simulators that use critical path calculation, e.g. crystal, usually give very conservative results because no node logic values are assumed. Therefore, it is more accurate to use circuit simulations to determine the delay time (and hence the speed) of digital circuits. In this situation, to reduce simulation time, the minimization of the test pattern size becomes the primary issue. In this paper a simple but highly effective method to determine the worst-case delay time of digital circuits with known structures is presented. The method is applied to arithmetic units, such as adders
  • Keywords
    VLSI; adders; circuit analysis computing; delays; digital arithmetic; digital integrated circuits; integrated circuit testing; integrated logic circuits; logic testing; adders; arithmetic units; circuit simulation; delay time measurement; digital VLSI circuits; maximum speed; test pattern size minimisation; worst-case delay time; Added delay; Adders; Circuit simulation; Delay effects; Digital circuits; Fabrication; Logic; Minimization; Time measurement; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
  • Conference_Location
    Lafayette, LA
  • Print_ISBN
    0-7803-2428-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1994.519236
  • Filename
    519236