DocumentCode :
2983379
Title :
Determination of the characteristic life time of paper-insulated MV-cables based on a partial discharge and tan(δ) diagnosis
Author :
Mladenovic, I. ; Weindl, Ch
Author_Institution :
Inst. of Electr. Power Syst., Univ. of Erlangen-Nuremberg, Erlangen
fYear :
2008
fDate :
1-3 Sept. 2008
Firstpage :
2022
Lastpage :
2027
Abstract :
Monitoring the condition of electrical equipment insulation by means of partial discharge measurement and analysis is an effective diagnostic tool for the prediction of service failures. In this paper an accelerated aging system specialized for paper insulated lead covered (PILC) cables, with a highly sensitive and selective PD-detection/localization and tan(delta) measurement is presented. It facilitates the monitoring of the entire aging process and the later development of sophisticated diagnostic criteria based on the physical aging process.
Keywords :
condition monitoring; dielectric loss measurement; failure analysis; insulation testing; life testing; paper; partial discharge measurement; power cable insulation; power cable testing; accelerated aging system; condition monitoring; electrical equipment insulation; life-time characteristics; paper-insulated MV-cables; paper-insulated lead covered cables; partial discharge measurement; physical aging process; service failure prediction; tan(delta) diagnosis; Accelerated aging; Cable insulation; Condition monitoring; Dielectrics and electrical insulation; Electric variables measurement; Failure analysis; Partial discharge measurement; Partial discharges; Software measurement; Voltage control; Diagnostics; Estimation Technique; Insulation; Maintenance; Measurement; Partial Discharge; Prognosis; Software for Measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Motion Control Conference, 2008. EPE-PEMC 2008. 13th
Conference_Location :
Poznan
Print_ISBN :
978-1-4244-1741-4
Electronic_ISBN :
978-1-4244-1742-1
Type :
conf
DOI :
10.1109/EPEPEMC.2008.4635563
Filename :
4635563
Link To Document :
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