Title :
A simple approach to the evaluation of multistage interconnection network reliability
Author :
Chuang, Po-Jen ; Kuo, Chun-Liang
Author_Institution :
Dept. of Electr. Eng., Tamkang Univ., Tamsui, Taiwan
Abstract :
The terminal reliability is an important performance parameter in the design of a highly reliable multistage interconnection network (MIN). In this paper we present a new method which is able to evaluate the terminal reliability of any MIN, with a rather simplified procedure. Implementation considerations and discussions are also provided
Keywords :
Boolean algebra; multistage interconnection networks; reliability theory; highly reliable network design; multistage interconnection network; performance parameter; terminal reliability evaluation; Arithmetic; Contracts; Ducts; Multiprocessor interconnection networks; Switches; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
Conference_Location :
Lafayette, LA
Print_ISBN :
0-7803-2428-5
DOI :
10.1109/MWSCAS.1994.519247
