DocumentCode :
2983539
Title :
Lattice damages in quartz crystal blanks influence on the resonator properties and on the X-ray measurement
Author :
Seydel, E. ; Berger, H. ; Hildebrandt, G. ; Bradaczek, H.
Author_Institution :
Vita-Chem. GmbH, Berlin, Germany
fYear :
2004
fDate :
23-27 Aug. 2004
Firstpage :
109
Lastpage :
115
Abstract :
The temperature-frequency behavior of quartz crystals depends on the as-grown lattice defects in the volume as well as on process-induced surface damage. The influence of some special lattice distortions on the vibration behavior is calculated, assuming some simplified models. The degree of lattice damage is measured on blanks of different manufacturers and after different surface processing by means of the X-ray Θ-scan and Ω-scan methods. Single grains in the measuring area as well as reflection curve broadening and intensity changes are detected. It is necessary to check the lattice damage in blanks before further production steps in order to avoid crystal losses due to such damage. The curve-width and intensity measurement can be combined with automatic cut angle sorting, and the corresponding values can be used as additional sorting criteria.
Keywords :
crystal defects; crystal resonators; quartz; X-ray measurement; as-grown lattice defects; crystal resonator properties; process-induced surface damage; quartz crystal lattice damage; temperature-frequency behavior; Crystals; Distortion measurement; Frequency measurement; Lattices; Production; Reflection; Sorting; Surface resistance; Surface topography; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
ISSN :
1075-6787
Print_ISBN :
0-7803-8414-8
Type :
conf
DOI :
10.1109/FREQ.2004.1418437
Filename :
1418437
Link To Document :
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