DocumentCode :
2983571
Title :
Multistage chemical etching for high-precision adjustment of resonance frequencies in ultrahigh-frequency-fundamental quartz resonators
Author :
Iwata, Hirokazu
Author_Institution :
Adv. R&D Div., Toyo Commun. Equip. Co.- Ltd., Kanagawa, Japan
fYear :
2004
fDate :
23-27 Aug. 2004
Firstpage :
121
Lastpage :
124
Abstract :
Chemical etching to make uniform the thickness of the vibrating areas of multiple resonators in a single wafer was applied to inverted-mesa quartz resonators exciting an ultrahigh-frequency-fundamental thickness vibration. The process consists of five stages, combining high-rate etching for high productivity and low-rate etching for high-precision adjustment. By using this process, the resonance frequencies of 41 resonators in the wafer were adjusted to 620 ± 1.5 MHz, which correspond to thicknesses 2.2 μm ± 6 nm of the vibrating areas.
Keywords :
acoustic resonance; crystal resonators; etching; 2.2 micron; 620 MHz; inverted-mesa quartz resonators; multiple resonators; multistage chemical etching; resonance frequencies; ultrahigh-frequency-fundamental quartz resonators; vibrating areas; Chemical processes; Chemical products; Dry etching; Frequency conversion; Hafnium; Oscillators; Productivity; Research and development; Resonance; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
ISSN :
1075-6787
Print_ISBN :
0-7803-8414-8
Type :
conf
DOI :
10.1109/FREQ.2004.1418439
Filename :
1418439
Link To Document :
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