Title :
Reducing PM-to-AM conversion and the light-shift in laser-pumped, vapor-cell atomic clocks
Author :
Camparo, J.C. ; Coffer, J.G. ; Townsend, J.J.
Author_Institution :
Electron. & Photonics Lab., Aerosp. Corp., El Segundo, CA, USA
Abstract :
The alkali vapor-cell atomic clock, either conventional or coherent-population-trapping (CPT), offers one of the most viable approaches to an ultraminiature device. Unfortunately, this atomic clock suffers from two laser-induced noise processes, laser phase-noise (PM) to amplitude-noise (AM) conversion and ac-Stark shift fluctuations. Here, we demonstrate a method to circumvent these problems in a passive and miniaturizable manner based on pressure-broadening of the relevant optical transition. For this purpose, we have constructed a conventional atomic clock employing Rb87 vapor confined with 100 torr of N2. In this high-pressure environment, both PM-to-AM conversion efficiency and the ac-Stark shift are reduced. Though we employ a "phase-noisy," cleaved-facet diode laser, and lock the laser frequency to the pressure-broadened 1.6 GHz D1 absorption line of Rb, we obtain excellent short-term frequency stability (i.e., σy(τ) = 1.8x10-12/τ12/). Moreover, since a single resonance cell generates locking signals for both the laser wavelength and the crystal oscillator, the atomic clock has real potential for miniaturization.
Keywords :
atomic clocks; laser frequency stability; laser noise; optical pumping; phase noise; semiconductor lasers; 1.6 GHz; N2; PM-to-AM conversion; Rb87; ac-Stark shift fluctuations; alkali vapor-cell atomic clock; cleaved-facet diode laser; coherent population trapping; high-pressure environment; laser phase-noise to amplitude-noise conversion; laser-induced noise processes; laser-pumped atomic clocks; light shift; optical transition; pressure broadening; short-term frequency stability; ultraminiature device; Atom lasers; Atomic clocks; Fluctuations; Frequency; Laser noise; Laser stability; Laser transitions; Noise level; Optical noise; Phase noise;
Conference_Titel :
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
Print_ISBN :
0-7803-8414-8
DOI :
10.1109/FREQ.2004.1418442