Title :
High Performance BICS Design for IDDQ Testing Application
Author :
Hsu, Chun-Lung ; Ho, Mean-Hom
Author_Institution :
Nat. Dong Hwa Univ., Hualien
Abstract :
Quiescent supply current (IDDQ) testing is a useful test method for CMOS circuit and can be combined with functional testing to reduce total test time and increase reliability. This paper designed a high-performance built-in current sensor (HP-BICS) for Iddq testing applications. The proposed HP-BICS can attain small detection time and low power dissipation for ensuring the reliability and reducing the impact of the circuit under test (CUT) during testing. Simulation results show that the proposed HP-BICS has a much performance improvement compared with the previous works.
Keywords :
CMOS integrated circuits; built-in self test; electric sensing devices; integrated circuit reliability; integrated circuit testing; CMOS circuit; built-in current sensor; circuit reliability; circuit under test; high performance BICS design; low power dissipation; quiescent supply current testing; Automatic testing; CMOS logic circuits; Circuit testing; Condition monitoring; Current supplies; Integrated circuit testing; Logic testing; MOS devices; Power dissipation; Voltage;
Conference_Titel :
Electron Devices and Solid-State Circuits, 2007. EDSSC 2007. IEEE Conference on
Conference_Location :
Tainan
Print_ISBN :
978-1-4244-0637-1
Electronic_ISBN :
978-1-4244-0637-1
DOI :
10.1109/EDSSC.2007.4450247
