• DocumentCode
    2983724
  • Title

    Measurement error models and fault-detection algorithms for multi-constellation navigation systems

  • Author

    Joerger, Mathieu ; Neale, Jason ; Pervan, Boris ; Datta-Barua, Seebany

  • Author_Institution
    Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2010
  • fDate
    4-6 May 2010
  • Firstpage
    927
  • Lastpage
    946
  • Abstract
    The integration of ranging signals from multiple satellite constellations opens the possibility for rapid, robust and accurate positioning over wide areas. Algorithms for the simultaneous estimation of carrier phase cycle ambiguities and user position and for the detection of faults over a fixed smoothing time-interval were derived in previous work. For high-integrity precision applications, ensuring the robustness of measurement error and fault-models is an exacting task, especially when considering sequences of observations. In this research, a new RAIM-based approach is established, which aims at directly determining the worst-case single-satellite fault profile. Also, the robustness of newly derived ionospheric error models is experimentally evaluated using dual-frequency GPS data collected over several months at multiple locations. An integrity analysis is devised to quantify the impact of traveling ionospheric disturbances (TIDs) on the final user position solution. Finally, overall navigation system performance is assessed for various combinations of GPS, Galileo and low earth orbiting Iridium satellite signals.
  • Keywords
    Fault detection; Global Positioning System; Low earth orbit satellites; Measurement errors; Phase detection; Phase estimation; Robustness; Satellite constellations; Satellite navigation systems; Smoothing methods; Iridium; fault detection; multi-constellation; robust modeling; traveling ionospheric disturbance (TID);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Position Location and Navigation Symposium (PLANS), 2010 IEEE/ION
  • Conference_Location
    Indian Wells, CA, USA
  • ISSN
    2153-358X
  • Print_ISBN
    978-1-4244-5036-7
  • Electronic_ISBN
    2153-358X
  • Type

    conf

  • DOI
    10.1109/PLANS.2010.5507228
  • Filename
    5507228