• DocumentCode
    2983827
  • Title

    Overview: connector contact quality

  • Author

    Malucci, Robert D.

  • Author_Institution
    Molex Inc., Lisle, IL, USA
  • fYear
    1989
  • fDate
    18-20 Sep 1989
  • Firstpage
    95
  • Abstract
    Summary form only given. Electrical connectors are passive devices that interconnect circuit elements through low-resistance stationary contacts. For an electronic system to perform reliably, the interconnect system must be reliable in the environment and throughout the expected life of the system. It is noted that building reliability and quality into an electrical interconnect system is a very complex process that depends on systematically addressing these issues at every step of the development cycle through the initial production phase. The major steps in the development cycle through initial production were reviewed with regard to reliability and quality. This included topics such as system requirements, contact physics considerations, product design, tool build, initial production, qualification testing, and process control. In addition, an attempt was made to define the number of variables involved in defining requirements, specifying designs, manufacturing products, and controlling the processes involved in producing and maintaining quality products
  • Keywords
    electric connectors; quality control; connector contact quality; contact physics considerations; defining requirements; development cycle; electrical interconnect system; initial production phase; low-resistance stationary contacts; overview; process control; product design; qualification testing; quality; reliability; specifying designs; system requirements; tool build; variables involved; Connectors; Contacts; Integrated circuit interconnections; Manufacturing processes; Physics; Process control; Product design; Production systems; Qualifications; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1989., Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on
  • Conference_Location
    Chicago, IL
  • Type

    conf

  • DOI
    10.1109/HOLM.1989.77923
  • Filename
    77923