DocumentCode
2984022
Title
Deep Learning to Hash with Multiple Representations
Author
Yoonseop Kang ; Saehoon Kim ; Seungjin Choi
Author_Institution
Dept. of Comput. Sci. & Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
fYear
2012
fDate
10-13 Dec. 2012
Firstpage
930
Lastpage
935
Abstract
Hashing seeks an embedding of high-dimensional objects into a similarity-preserving low-dimensional Hamming space such that similar objects are indexed by binary codes with small Hamming distances. A variety of hashing methods have been developed, but most of them resort to a single view (representation) of data. However, objects are often described by multiple representations. For instance, images are described by a few different visual descriptors (such as SIFT, GIST, and HOG), so it is desirable to incorporate multiple representations into hashing, leading to multi-view hashing. In this paper we present a deep network for multi-view hashing, referred to as deep multi-view hashing, where each layer of hidden nodes is composed of view-specific and shared hidden nodes, in order to learn individual and shared hidden spaces from multiple views of data. Numerical experiments on image datasets demonstrate the useful behavior of our deep multi-view hashing (DMVH), compared to recently-proposed multi-modal deep network as well as existing shallow models of hashing.
Keywords
cryptography; image coding; image representation; learning (artificial intelligence); Hamming distance; binary code; data single view representation; deep learning; hashing method; high-dimensional object; image dataset; multiple representation; multiview hashing; shared hidden node; similarity-preserving low-dimensional Hamming space; view-specific hidden node; visual descriptor; Binary codes; Computational modeling; Hamming distance; Linear programming; Machine learning; Training; Visualization; deep learning; harmonium; hashing; multi-view learning; restricted Boltzmann machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining (ICDM), 2012 IEEE 12th International Conference on
Conference_Location
Brussels
ISSN
1550-4786
Print_ISBN
978-1-4673-4649-8
Type
conf
DOI
10.1109/ICDM.2012.24
Filename
6413830
Link To Document