DocumentCode :
2984128
Title :
Relative entropy and score function: New information-estimation relationships through arbitrary additive perturbation
Author :
Guo, Dongning
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL, USA
fYear :
2009
fDate :
June 28 2009-July 3 2009
Firstpage :
814
Lastpage :
818
Abstract :
This paper establishes new information-estimation relationships pertaining to models with additive noise of arbitrary distribution. In particular, we study the change in the relative entropy between two probability measures when both of them are perturbed by a small amount of the same additive noise. It is shown that the rate of the change with respect to the energy of the perturbation can be expressed in terms of the mean squared difference of the score functions of the two distributions, and, rather surprisingly, is unrelated to the distribution of the perturbation otherwise. The result holds true for the classical relative entropy (or Kullback-Leibler distance), as well as two of its generalizations: Reacutenyi´s relative entropy and the f-divergence. The result generalizes a recent relationship between the relative entropy and mean squared errors pertaining to Gaussian noise models, which in turn supersedes many previous information-estimation relationships. A generalization of the de Bruijn identity to non-Gaussian models can also be regarded as consequence of this new result.
Keywords :
Gaussian noise; entropy; mean square error methods; Gaussian noise models; Kullback-Leibler distance; Reacutenyi´s relative entropy; additive noise; arbitrary additive perturbation; arbitrary distribution; de Bruijn identity; f-divergence; information-estimation relationships; mean squared errors; score function; Additive noise; Computer science; Entropy; Gaussian noise; Mutual information; Noise measurement; Particle measurements; Q measurement; Random variables; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory, 2009. ISIT 2009. IEEE International Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-4312-3
Electronic_ISBN :
978-1-4244-4313-0
Type :
conf
DOI :
10.1109/ISIT.2009.5205652
Filename :
5205652
Link To Document :
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