Title : 
Magnetoresistance in MOSFETs with ferromagnetic MnAs source and drain contacts: Spin injection and transport in Si MOS channels
         
        
            Author : 
Nakane, R. ; Harada, T. ; Sugiura, K. ; Sugahara, S. ; Tanaka, M.
         
        
            Author_Institution : 
Dept. of Electron. Eng., Univ. of Tokyo, Tokyo
         
        
        
        
        
        
            Abstract : 
Summary form only given. Recently-proposed spin metal-oxide-semiconductor field-effect transistors (spin MOSFETs) are expected to be key devices for advancing the integrated circuit technology beyond the CMOS scaling. Towards the integration of spin MOSFETs with a CMOS platform, experimental demonstration and critical understanding of output characteristics are strongly needed. In this paper, we present the magnetoresistance and spin transport in MOSFETs with ferromagnetic MnAs source/drain (S/D) contacts.
         
        
            Keywords : 
CMOS integrated circuits; MOSFET; elemental semiconductors; ferromagnetic materials; magnetoresistance; manganese compounds; silicon; spin polarised transport; CMOS scaling; MOSFET; MnAs; Si; drain contacts; ferromagnetic source; ferromagnetic source/drain contacts; magnetoresistance; source contacts:; spin injection; spin metal-oxide-semiconductor field-effect transistors; spin transport; CMOS technology; Dielectric substrates; Integrated circuit technology; MOSFETs; Magnetic field measurement; Magnetic hysteresis; Magnetoresistance; Molecular beam epitaxial growth; Spin polarized transport; Temperature dependence;
         
        
        
        
            Conference_Titel : 
Device Research Conference, 2008
         
        
            Conference_Location : 
Santa Barbara, CA
         
        
        
            Print_ISBN : 
978-1-4244-1942-5
         
        
            Electronic_ISBN : 
1548-3770
         
        
        
            DOI : 
10.1109/DRC.2008.4800815