DocumentCode :
2984544
Title :
A generalization of multiple and high-order scattering formulations in models for rough surface scattering
Author :
Yan, Jian ; Hong, Wen ; Cao, Fang ; Yin, Qiang
Author_Institution :
Nat. Key Lab. of Microwave Imaging Technol., Beijing, China
fYear :
2009
fDate :
26-30 Oct. 2009
Firstpage :
404
Lastpage :
407
Abstract :
The paper focuses on two basic concepts, the high order scattering, proposed due to the high order solution of analytic scattering formulations, and the multiple scattering, defined according to the physical mechanism, in frequently-mentioned models that describe scattering from a randomly rough surface. These two concepts are related in this paper through a review of widespread models on treating high order scattering, which leads to a conclusion that high order scattering can be expressed as multiple scattering among different frequency components of the rough surface. Based on the conclusion, a general model, with a form refined from the involved models and several parameters to be given from experimental data, is presented.
Keywords :
boundary integral equations; electromagnetic wave scattering; rough surfaces; surface scattering; high-order scattering formulations; multiple scattering; rough surface scattering; Backscatter; Dielectrics; Frequency; Microwave imaging; Microwave technology; Rough surfaces; Scanning probe microscopy; Scattering; Surface roughness; Surface treatment; High order scattering; Multiple Scattering; Scattering models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Synthetic Aperture Radar, 2009. APSAR 2009. 2nd Asian-Pacific Conference on
Conference_Location :
Xian, Shanxi
Print_ISBN :
978-1-4244-2731-4
Electronic_ISBN :
978-1-4244-2732-1
Type :
conf
DOI :
10.1109/APSAR.2009.5374331
Filename :
5374331
Link To Document :
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