Title :
Frequency shifts in crystal resonators due to intrinsic stresses in unequal thickness electrodes
Author :
Yang, Xiaomeng ; Yang, Jiashi ; Kosinski, John A. ; Turner, Joseph A.
Author_Institution :
Dept. of Eng. Mech., Nebraska Univ., Lincoln, NE, USA
Abstract :
We study frequency shifts in crystal resonators due to intrinsic stresses from electrodes with different thickness. The first-order perturbation integral, as developed by Tiersten for frequency shifts in resonators, is used. Frequency shifts in rotated Y-cut quartz thickness-shear resonators are calculated. The effect of asymmetric electrodes is examined.
Keywords :
crystal resonators; electrodes; stress effects; asymmetric electrodes; crystal resonators; first-order perturbation integral; frequency shifts; intrinsic stresses; rotated Y-cut quartz; thickness-shear resonators; unequal thickness electrodes; Capacitive sensors; Electrodes; Ferroelectric materials; Integral equations; Resonant frequency; Stress; Transmission line matrix methods; Ultrasonics, ferroelectrics, and frequency control; Vibrations;
Conference_Titel :
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
Print_ISBN :
0-7803-8414-8
DOI :
10.1109/FREQ.2004.1418483
