Title :
2002 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.02TH8658)
Abstract :
Presents the title page and table of contents for the 2002 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.02TH8658).
Keywords :
III-V semiconductors; gallium arsenide; heterojunction bipolar transistors; high electron mobility transistors; hot carriers; integrated circuit reliability; life testing; semiconductor device reliability; GaAs; GaAs-based HBT reliability; GaN; GaN HEMTs; InP; InP-based HBT reliability; PHEMTs; accelerated life test; current collapse; hot electron effects; reliability tests;
Conference_Titel :
GaAs Reliability Workshop, 2002
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7908-0103-5
DOI :
10.1109/GAAS.2002.1167851
