Title :
Evolution of the UWA solid nitrogen dual mode sapphire oscillator, JULIA
Author :
Anstie, J.D. ; Hartnett, J.G. ; Tobar, M.E. ; Ivanov, E.N. ; Stanwix, P.L.
Author_Institution :
Sch. of Phys., Univ. of Western Australia, Crawley, WA, Australia
Abstract :
Low temperature, high precision sapphire oscillators rely on a turning point in mode frequency-temperature dependence at around 10 K. This, along with sapphire´s extremely low dielectric losses at microwave frequencies, allows fractional frequency stabilities on the order of 10-15. At higher temperatures, the lack of a turning point makes a single mode oscillator very sensitive to temperature fluctuations. By exciting two quasi-orthogonal whispering gallery (WG) modes, a turning point can be found in their beat frequency. A novel temperature control technique has been used to maintain the sapphire at the turning point temperature and a fractional frequency instability of 4.3×10-14 at 1 s integration time, dropping to 3.5×10-14 at 30 seconds integration time, has been measured.
Keywords :
cryogenic electronics; crystal oscillators; frequency stability; frequency standards; nitrogen; sapphire; temperature; temperature control; whispering gallery modes; beat frequency; fractional frequency instability; fractional frequency stability; frequency standard; frequency-temperature dependence; low dielectric losses; quasi-orthogonal whispering gallery modes; solid nitrogen dual mode sapphire oscillator; temperature control technique; turning point; Dielectric losses; Fluctuations; Microwave frequencies; Microwave oscillators; Nitrogen; Solids; Stability; Temperature dependence; Temperature sensors; Turning;
Conference_Titel :
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
Print_ISBN :
0-7803-8414-8
DOI :
10.1109/FREQ.2004.1418486