• DocumentCode
    2984873
  • Title

    Embedded Process Development of Passive Component and Characterization Analysis for Organic Packaging Substrate

  • Author

    Tai, Yu-Che ; Lai, Chi-Chang ; Wu, Sung-Mao ; Jahja, Endruw ; Wang, Jui-Wen

  • Author_Institution
    Nat. Univ. of Kaohsiung, Kaohsiung
  • fYear
    2007
  • fDate
    20-22 Dec. 2007
  • Firstpage
    1055
  • Lastpage
    1057
  • Abstract
    Operating frequency and speed growth rapidly today, 3C product demand more light, thin and small that can easily to bring anywhere. That´s mean more complex IC package architecture and high performance substrate design to place maximum amount of passives with lower interconnect are decisive factors of product successful. In this study, present an integrated process to place more than one discrete capacitor in packaging substrate by build via. And relation electrical performances is measured by Vector Network Analysis with high frequency probing system, high frequency EM simulation done by Ansoft 3D full wave EM solver will be presented also in this study completely. Study result indicted that embedded capacitor technology has the potential to perform high electrical performance and cost/area saving denser packaging.
  • Keywords
    capacitors; integrated circuit packaging; passive networks; substrates; 3C product demand; Ansoft 3D full wave EM solver; IC package architecture; characterization analysis; discrete capacitor; embedded capacitor technology; embedded process development; high frequency EM simulation; high frequency probing system; high performance substrate design; integrated process; organic packaging substrate; passive component; substrate packaging; vector network analysis; Capacitors; Copper; Electric variables measurement; Electronics packaging; Fabrication; Frequency measurement; Integrated circuit packaging; Performance analysis; Performance evaluation; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2007. EDSSC 2007. IEEE Conference on
  • Conference_Location
    Tainan
  • Print_ISBN
    978-1-4244-0637-1
  • Electronic_ISBN
    978-1-4244-0637-1
  • Type

    conf

  • DOI
    10.1109/EDSSC.2007.4450309
  • Filename
    4450309