• DocumentCode
    2984992
  • Title

    Co-labeling: A New Multi-view Learning Approach for Ambiguous Problems

  • Author

    Wen Li ; Lixin Duan ; Tsang, Ivor Wai-Hung ; Dong Xu

  • Author_Institution
    Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Firstpage
    419
  • Lastpage
    428
  • Abstract
    We propose a multi-view learning approach called co-labeling which is applicable for several machine learning problems where the labels of training samples are uncertain, including semi-supervised learning (SSL), multi-instance learning (MIL) and max-margin clustering (MMC). Particularly, we first unify those problems into a general ambiguous problem in which we simultaneously learn a robust classifier as well as find the optimal training labels from a finite label candidate set. To effectively utilize multiple views of data, we then develop our co-labeling approach for the general multi-view ambiguous problem. In our work, classifiers trained on different views can teach each other by iteratively passing the predictions of training samples from one classifier to the others. The predictions from one classifier are considered as label candidates for the other classifiers. To train a classifier with a label candidate set for each view, we adopt the Multiple Kernel Learning (MKL) technique by constructing the base kernel through associating the input kernel calculated from input features with one label candidate. Compared with the traditional co-training method which was specifically designed for SSL, the advantages of our co-labeling are two-fold: 1) it can be applied to other ambiguous problems such as MIL and MMC, 2) it is more robust by using the MKL method to integrate multiple labeling candidates obtained from different iterations and biases. Promising results on several real-world multi-view data sets clearly demonstrate the effectiveness of our proposed co-labeling for both MIL and SSL.
  • Keywords
    learning (artificial intelligence); pattern classification; pattern clustering; set theory; MIL; MKL technique; MMC; SSL; ambiguous problems; colabeling approach; finite label candidate set; input kernel; machine learning problems; max-margin clustering; multiinstance learning; multiple kernel learning technique; multiple labeling candidates; multiview ambiguous problem; multiview learning approach; optimal training labels; real-world multiview data sets; robust classifier; semisupervised learning; training samples; Kernel; Labeling; Prediction algorithms; Robustness; Semisupervised learning; Supervised learning; Training; TBIR; ambiguous learning; multi-instance learning; multiple kernel learning; semi-supervised learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining (ICDM), 2012 IEEE 12th International Conference on
  • Conference_Location
    Brussels
  • ISSN
    1550-4786
  • Print_ISBN
    978-1-4673-4649-8
  • Type

    conf

  • DOI
    10.1109/ICDM.2012.78
  • Filename
    6413882