DocumentCode :
298516
Title :
Growth of epitaxial CdTe/CdS heterostructures for single crystal thin film solar cell applications
Author :
Kessler, K. ; Tiwari, Ayodhya N. ; Blunier, S. ; Zogg, H.
Author_Institution :
AFIF, Swiss Federal Inst. of Technol., Zurich, Switzerland
Volume :
1
fYear :
1994
fDate :
5-9 Dec 1994
Firstpage :
323
Abstract :
Epitaxial CdTe/CdS heterostructures have been grown by molecular beam epitaxy onto BaF2 covered Si (111) substrates. An epitaxial BaF2 buffer is used for compatibility reasons, and because of easier dissolution during the lift-off processing. Epitaxy of cubic CdS (111) layers on BaF2/Si (111) is achieved; electron channelling patterns exhibit a three-fold symmetry which is a characteristic for cubic crystal structures. The growth kinetics and structural properties of epitaxial CdS and CdTe/CdS have been studied with reflection high energy electron diffraction, Rutherford backscattering spectrometry and X-ray diffraction rocking curve measurements. The full width at half maximum of the (222) CdS and (333) CdTe X-ray peaks are ~1150 arcsec for 2.7 and 3.4 μm thick CdS and CdTe layers, respectively. To fabricate CdTe/CdS single crystal thin film solar cells, a lift-off process has been developed to remove the epitaxial layers from the Si substrates
Keywords :
II-VI semiconductors; Rutherford backscattering; X-ray diffraction; cadmium compounds; molecular beam epitaxial growth; p-n heterojunctions; reflection high energy electron diffraction; semiconductor device testing; semiconductor growth; solar cells; substrates; 2.7 mum; 3.4 mum; BaF2; CdTe-CdS; Rutherford backscattering spectrometry; Si; X-ray diffraction rocking curve measurements; cubic crystal structures; dissolution; electron channelling patterns; epitaxial BaF2 buffer; epitaxial heterostructures growth; growth kinetics; lift-off processing; molecular beam epitaxy; reflection high energy electron diffraction; semiconductor; single crystal thin film solar cell; substrates; three-fold symmetry; Backscatter; Electrons; Energy measurement; Epitaxial growth; Kinetic theory; Molecular beam epitaxial growth; Optical reflection; Spectroscopy; Substrates; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
Type :
conf
DOI :
10.1109/WCPEC.1994.519873
Filename :
519873
Link To Document :
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