Title :
The Reproducibility of Cadmium Selenide TFT´s and their Use in Driver Circuits
Author :
Lee, M.J. ; Judge, C.P. ; Wright, S.W.
Author_Institution :
Imperial College of Science
Keywords :
Cadmium compounds; Dielectrics; Displays; Driver circuits; Length measurement; Parasitic capacitance; Reproducibility of results; Shift registers; Switches; Threshold voltage;
Conference_Titel :
Device Research Conference, 1992. Digest. 50th Annual
Conference_Location :
Cambridge, MA, USA
DOI :
10.1109/DRC.1992.671896
