Title :
Corrosive gas environmental testing for electrical contacts
Author :
Gore, Randy ; Witska, Rich ; Kirby, J. Ray ; Chao, Jim
Author_Institution :
IBM Corp., Research Triangle Park, NC, USA
Abstract :
Corrosive gas environmental tests are used to predict the reliability of electrical connectors used in data system products under conditions found in business office environments. A corrosive gaseous environmental acceleration test called G1(T) is evaluated through variations in testing conditions, in particular for those which differ from outside testing standards used in the connector industry. An investigation of those features of various acceleration tests which could be recommended for adoption into an industry-wide testing standard are reported. These studies could be important for gaining a consensus for support of an acceleration testing practice to predict corrosion reliability during the life of a product. Copper, nickel, and porous gold coupons (electroplated gold over nickel over copper) are used to determine the effects of each corrosive gas test environment. The corrosion of copper is quantified by coulometric reduction, while nickel is evaluated by energy dispersive X-ray fluorescence analysis. The porous gold coupons are visually examined for the presence of pore and creep corrosion, which makes it possible to determine the degree of environmental exposure quickly
Keywords :
corrosion testing; electric connectors; electrical contacts; environmental testing; life testing; reliability; Cu; Cu-Ni-Au layers; Ni; acceleration testing practice; acceleration tests; business office environments; corrosion reliability prediction; corrosive gas environmental testing; corrosive gas test environment; corrosive gaseous environmental acceleration test; coulometric reduction; creep corrosion; data system products; electrical connectors; electrical contacts; energy dispersive X-ray fluorescence analysis; industry-wide testing standard; porous Au; testing conditions; Connectors; Contacts; Copper; Corrosion; Data systems; Electrical products industry; Gold; Life estimation; Nickel; System testing;
Conference_Titel :
Electrical Contacts, 1989., Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on
Conference_Location :
Chicago, IL
DOI :
10.1109/HOLM.1989.77931