DocumentCode :
2985542
Title :
Hierarchical Multilabel Classification with Minimum Bayes Risk
Author :
Wei Bi ; Kwok, James T.
Author_Institution :
Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
fYear :
2012
fDate :
10-13 Dec. 2012
Firstpage :
101
Lastpage :
110
Abstract :
Hierarchical multilabel classification (HMC) allows an instance to have multiple labels residing in a hierarchy. A popular loss function used in HMC is the H-loss, which penalizes only the first classification mistake along each prediction path. However, the H-loss metric can only be used on tree-structured label hierarchies, but not on DAG hierarchies. Moreover, it may lead to misleading predictions as not all misclassifications in the hierarchy are penalized. In this paper, we overcome these deficiencies by proposing a hierarchy-aware loss function that is more appropriate for HMC. Using Bayesian decision theory, we then develop a Bayes-optimal classifier with respect to this loss function. Instead of requiring an exhaustive summation and search for the optimal multilabel, the proposed classification problem can be efficiently solved using a greedy algorithm on both tree-and DAG-structured label hierarchies. Experimental results on a large number of real-world data sets show that the proposed algorithm outperforms existing HMC methods.
Keywords :
Bayes methods; decision theory; greedy algorithms; pattern classification; Bayes-optimal classifier; Bayesian decision theory; DAG-structured label hierarchy; H-loss metric; greedy algorithm; hierarchical multilabel classification; hierarchy-aware loss function; minimum Bayes risk; optimal multilabel; tree-structured label hierarchy; Bayesian methods; Bismuth; Decision theory; Greedy algorithms; Optimization; Prediction algorithms; Support vector machines; Bayesian decision theory; hierarchical classification; multilabel classification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining (ICDM), 2012 IEEE 12th International Conference on
Conference_Location :
Brussels
ISSN :
1550-4786
Print_ISBN :
978-1-4673-4649-8
Type :
conf
DOI :
10.1109/ICDM.2012.42
Filename :
6413911
Link To Document :
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