Title :
21st International Conference on VLSI Design - Title page
Abstract :
The following topics are dealt with: fault tolerance; wireless communication; embedded systems; testing/DFT; interconnects; analog performance; physical design/CAD; low power electronics; on-chip networks; design/MEMS/optical; circuit synthesis; standards in EDA.
Keywords :
VLSI; circuit CAD; design for testability; embedded systems; fault tolerance; interconnections; low-power electronics; micromechanical devices; network-on-chip; radiocommunication; CAD; DFT; VLSI design; analog performance; circuit synthesis; embedded system; fault tolerance; interconnects; low power electronics; wireless communication;
Conference_Titel :
VLSI Design, 2008. VLSID 2008. 21st International Conference on
Conference_Location :
Hyderabad
Print_ISBN :
0-7695-3083-4
DOI :
10.1109/VLSI.2008.1
