DocumentCode :
2985689
Title :
Vibration modes analysis by X-ray topography in quartz and langasite resonators
Author :
Mateescu, I. ; Capelle, B. ; Detaint, J. ; Johnson, G. ; Dumitrache, L. ; Bran, C.
Author_Institution :
Nat. Inst. of Mater. Phys., Bucharest, Romania
fYear :
2004
fDate :
23-27 Aug. 2004
Firstpage :
579
Lastpage :
584
Abstract :
This paper presents the results of the vibration modes measurements by X-ray topography in SC-cut quartz and Y-cut unpolished langasite resonators. A comparison of these results with X-ray diffraction topography images on AT-cut quartz resonators and Y-cut polished langasite resonators pointed out the behavior of mass-loading effect with plate orientation angle and with the surface state of the piezoelectric substrate. The results are compared with electrical measurements performed on the same resonators. 5 MHz Sawyer, plan parallel SC-cut quartz and Y-cut unpolished langasite resonators, with 14 mm plate diameter and various electrode thickness and diameters have been investigated on fundamental, third and fifth overtones. The study on SC-cut quartz resonators and unpolished Y-cut langasite resonators pointed out a good agreement with the results obtained on the same resonators by electrical measurements. The conclusion is that the SC-cut quartz resonator characteristics present a similarly harmonic dependence with those of the Y-cut langasite resonators thus revealing the stress-compensated feature of the Y-cut in langasite crystal.
Keywords :
X-ray topography; crystal orientation; crystal resonators; vibrational modes; 14 mm; 5 MHz; La3Ga5SiO14; SC-cut resonators; Sawyer resonators; SiO2; X-ray diffraction topography; Y-cut stress-compensated feature; Y-cut unpolished resonators; electrode diameter; electrode thickness; harmonic dependence; langasite resonators; mass-loading effect; piezoelectric substrate surface state; plan parallel resonators; plate orientation angle; quartz resonators; vibration modes measurement; Electric variables measurement; Electrodes; Frequency; Inductance; Performance evaluation; Stress; Surfaces; Vibration measurement; X-ray diffraction; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
ISSN :
1075-6787
Print_ISBN :
0-7803-8414-8
Type :
conf
DOI :
10.1109/FREQ.2004.1418524
Filename :
1418524
Link To Document :
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