• DocumentCode
    2985801
  • Title

    Hydrogenation Effects on Polysilicon Thin Film Transistor Structures

  • Author

    Hatalis, M.K. ; Kung, J.H. ; Kanicki, J.

  • Author_Institution
    Lehigh University
  • fYear
    1992
  • fDate
    21-24 June 1992
  • Keywords
    Dielectrics; Frequency; Hydrogen; Plasma applications; Plasma devices; Plasma displays; Plasma measurements; Plasma properties; Stress; Thin film transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1992. Digest. 50th Annual
  • Conference_Location
    Cambridge, MA, USA
  • Type

    conf

  • DOI
    10.1109/DRC.1992.671898
  • Filename
    671898