A comparative study of compositional and structural properties of CdTe thin films prepared by different electroplating techniques

Author

Paulson, P.D. ; Dutta, V. ; Singh, Chatar

Author_Institution

Photovoltaic Lab., Centre for Energy Studies, Indian Inst. of Technol., New Delhi, India

Volume

1

fYear

1994

fDate

5-9 Dec 1994

Firstpage

331

Abstract

The structural and compositional properties of CdTe films, deposited from an aqueous solution of CdSO₄ and TeO by pulsed electrodeposition, potentiostatic and galvanostatic electrodeposition, have been studied. Polycrystalline films with a preferred ⟨111⟩ orientation are obtained in all techniques. However, films deposited by pulsed techniques show the higher intensity for ⟨111⟩ peak. An EDAX study shows that, for lower concentrations of CdSO₄ in the electrolyte, pulsed films are more stoichiometric compared to films deposited by other two techniques

Keywords

II-VI semiconductors; X-ray chemical analysis; X-ray diffraction; cadmium compounds; electroplated coatings; electroplating; semiconductor thin films; stoichiometry; CdSO₄; CdTe; TeO; compositional properties; electrolyte; electroplating techniques; galvanostatic electrodeposition; polycrystalline films; potentiostatic electrodeposition; pulsed electrodeposition; stoichiometry; structural properties; thin film semiconductor; Frequency; Grain size; Laboratories; Optical films; Photovoltaic systems; Solar power generation; Tellurium; Transistors; Tribology; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on

Conference_Location

Waikoloa, HI

Print_ISBN

0-7803-1460-3

Type

conf

DOI

10.1109/WCPEC.1994.519968

Filename

519968