• DocumentCode
    2985907
  • Title

    CSP package development: the 4.0 manufactur1ng process for μBGA(R)

  • Author

    Solberg, Vern

  • Author_Institution
    Tessera Inc., San Jose, CA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    91
  • Lastpage
    103
  • Abstract
    A primary concern to anyone utilizing a new technology for high-density electronics is keeping development costs under control, optimization of existing manufacturing capability and minimizing the time-to-market. Chip-scale array package families for silicon products are already in the marketplace to assist the engineer and designer in meeting more demanding goals for electronic miniaturization. The significant advantage to employing the miniature chip-scale packaging technology is threefold; higher component density, more efficient assembly automation and enhanced product performance. Key factors that an engineer should consider before developing the product using CSP may include physical features and construction of the device, environmental or operating conditions for the end product, substrate material limitations and device attachment methodology. The course will present a detailed overview of industry trends in chip-scale package methodology and review the current status of standards for CSP. Material presented will assist the product developer in selecting and/or specifying specific physical attributes of the package structure. In addition, a step-by-step process description for the low cost μBGA package assembly will be outlined. The package assembly process presented will feature the automated 4.0 in-line configured for the new RAMBUS high-speed memory (RDRAM) adapting the most widely used chip-scale or chip-size package technology, μBGA
  • Keywords
    DRAM chips; assembling; ball grid arrays; chip scale packaging; environmental factors; μBGA; CSP package development; RAMBUS high-speed memory; RDRAM; assembly automation; component density; development costs; device attachment methodology; environmental conditions; high-density electronics; manufacturing capability; operating conditions; specific physical attributes; substrate material limitations; time-to-market; Assembly; Chip scale packaging; Components, packaging, and manufacturing technology; Consumer electronics; Cost function; Design engineering; Electronics packaging; Manufacturing processes; Silicon; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/99 Technical program, 1999. Proceedings of the
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-5475-3
  • Type

    conf

  • DOI
    10.1109/ELECTR.1999.779333
  • Filename
    779333