Title :
Changes in defects under external influence in langasite crystals
Author :
Dubovskiy, A. ; Domoroshchina, E. ; Kuz´micheva, G. ; Semenkovich, G.
Author_Institution :
Russian Res. Inst. for the Synthesis of Minerals, Alexandrov, Russia
Abstract :
In the growing process of multicomponent piezocrystalline crystals (La3Ga5SiO14), even minor deflections from optimal growth conditions lead to changes in defect concentration and, consequently, to changes in the properties of the whole crystal. A comprehensive study of the crystalline lattice using X-ray structural analysis and optical spectroscopy shows the formation of point defects - vacancies for oxygen and lanthanum, substitution of gallium by silicon and vice versa - that correspond with quasichemical reactions. In the spectrum of optical transmission, the band 35000 cm-1 is connected with a lanthanum vacancy (VLA´´´), and bands 28500, 26000, 25000 cm-1 with oxygen vacancies in three positions. Under γ-radiation to a dose of 200 C/kg, optical spectra are observed to increase absorption in the region 40000-30000 cm-1, but which disappear at the annealing temperature of 300°C. The value of absorption at frequency 40000 cm-1 can be used for the primary crystal quality assessment.
Keywords :
annealing; crystal defects; crystal structure; gallium compounds; gamma-ray effects; lanthanum compounds; light absorption; light transmission; piezoelectric materials; silicon compounds; 200 C/kg; 25000 to 40000 cm-1; 300 C; X-ray structural analysis; annealing temperature; crystal quality assessment; crystalline lattice; defect concentration; langasite crystals; lanthanum vacancies; multicomponent piezocrystalline crystals; optical absorption; optical spectra; optical spectroscopy; optical transmission; optimal growth conditions; oxygen vacancies; point defects; quasichemical reactions; substitution; Annealing; Crystallization; Crystals; Electromagnetic wave absorption; Gallium; Lanthanum; Lattices; Silicon; Spectroscopy; Temperature;
Conference_Titel :
Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
Print_ISBN :
0-7803-8414-8
DOI :
10.1109/FREQ.2004.1418538