DocumentCode
2986029
Title
Flaw Shape Characterization in 3D Volume Visualization in Ultrasonic Testing
Author
Matz, Vaclav ; Smid, Radislav ; Kreidl, Marcel ; Kerka, Jiri
Author_Institution
Dept. of Elec. Eng., Czech Tech. Univ., Prague
fYear
2006
fDate
Aug. 2006
Firstpage
938
Lastpage
943
Abstract
In general the ultrasonic testing is used for flaw detection and localization in tested materials. The flaws in materials are commonly characterized in measured ultrasonic signals by faults echoes. In the case of materials with coarse-grained structure the ultrasonic signal contains undesirable echoes caused by the scattering from these grains considered as noise. Another source of noise is caused by the electronic circuitry which is called electronic noise. These sources of noise make the flaw detection more difficult. The efficient methods for noise reduction have to be used. This paper evaluates different filtering methods used for noise reduction. Methods based on Wiener filtering, stationary wavelet transform, neural networks in 2D space are compared with conventional mathematical filtering methods based on median filter and mean value. The goal of this paper is to determine efficient method for noise reduction in B-scan for the exact flaw shape characterization. Filtered B-scans are used for the construction of 3D-volume visualization of flaws in the tested materials. Final 3D-volume visualization represents the flaw shape and is useful in the case of characterization of the flaw visualization
Keywords
Wiener filters; flat panel displays; flaw detection; median filters; neural nets; ultrasonic materials testing; wavelet transforms; 3D volume visualization; 3D-volume visualization; B-scan; Wiener filtering; coarse-grained structure; electronic circuitry; electronic noise; exact flaw shape characterization; flaw detection; flaw shape characterization; mathematical filtering methods; mean value; median filter; neural networks; noise reduction; stationary wavelet transform; ultrasonic signal measurement; ultrasonic testing; Circuit faults; Circuit noise; Circuit testing; Filtering; Materials testing; Noise reduction; Shape; Ultrasonic variables measurement; Visualization; Wiener filter; 2D stationary wavelet transform; 3D volume visualization; Ultrasonic testing; Wiener filtering; neural network;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing and Information Technology, 2006 IEEE International Symposium on
Conference_Location
Vancouver, BC
Print_ISBN
0-7803-9753-3
Electronic_ISBN
0-7803-9754-1
Type
conf
DOI
10.1109/ISSPIT.2006.270932
Filename
4042374
Link To Document