Title :
Improvement of a-Si solar cells fabricated by mercury-sensitized photo-CVD using H2 dilution method
Author :
Siamchai, Pavan ; Yamada, Akira ; Konagai, Makoto ; Jang, J.H. ; Lim, K.S.
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Japan
Abstract :
The high quality-wide bandgap i-layers prepared by the hydrogen dilution method were applied to a-Si solar cells fabricated by mercury-sensitized photo-CVD. It was found that the initial efficiency and stability of the cells were significantly improved compared to the undiluted one. This improvement was due to the increase in the quality and stability of an i-layer as confirmed by the dark I-V characteristics measurement of the solar cell. Two techniques for increasing the stabilized efficiency of the H2-diluted i-layer-based solar cell were employed. First, the use of appropriate bandgap profile leads to the increase in Jac while maintaining high FF, resulting in the increase in the stabilized efficiency. Another one is the improvement of Voc of the solar cell by the optimization of the p- and buffer layer. By lowering the temperature of p- and buffer layers, a solar cell with Voc as high as 0.990 V has been obtained
Keywords :
CVD coatings; amorphous semiconductors; chemical vapour deposition; electric current measurement; elemental semiconductors; hydrogen; silicon; solar cells; stability; voltage measurement; H2 dilution method; Si:H; a-Si:H solar cells fabrication; bandgap profile; buffer layer optimisation; dark I-V characteristics measurement; high quality-wide bandgap i-layers; i-layer; initial efficiency; mercury-sensitized photo-CVD; stability; Buffer layers; Degradation; Hydrogen; Optical films; Photonic band gap; Photovoltaic cells; Plasma chemistry; Plasma temperature; Stability; Substrates;
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1460-3
DOI :
10.1109/WCPEC.1994.520005