Title :
Fine Transmittance/Reflectivity Measurement System Using Single-Sideband Frequency Sweeper with Ultra-Wideband Hilbert Transformer
Author :
Kawanishi, Tetsuya ; Sakamoto, Takahide ; Fonseca, Daniel ; Cartaxo, Adolfo ; Monteiro, Paulo ; Izutsu, Masayuki
Author_Institution :
National Institute of Information and Communications Technology, 4-2-1 Nukui-Kitamachi, Koganei, Tokyo 184-8795, Japan e-mail: kawanish@nict.go.jp
Abstract :
A wideband transmittance/reflectivity measurement system for fine-structured components is proposed. The optical single-sideband frequency sweeper with an ultra wideband Hilbert transformer enables excellent frequency sweep range between 2GHz-30GHz. Frequency resolution of 4.7MHz is experimentally obtained.
Keywords :
Amplitude modulation; Frequency measurement; Optical devices; Optical modulation; Oscilloscopes; Radio frequency; Reflectivity; Telecommunications; Ultra wideband technology; Wavelength measurement;
Conference_Titel :
Optical Communications, 2006. ECOC 2006. European Conference on
Conference_Location :
Cannes, France
Print_ISBN :
978-2-912328-39-7
Electronic_ISBN :
978-2-912328-39-7
DOI :
10.1109/ECOC.2006.4800911
