DocumentCode

2986163

Title

Reliability evaluation on dual-etch-stop InGaAs PHEMTs

Author

Gao, Frank

fYear

2002

fDate

20 Oct. 2002

Firstpage

98

Lastpage

116

Keywords

Indium gallium arsenide; PHEMTs;

fLanguage

English

Publisher

ieee

Conference_Titel

GaAs Reliability Workshop, 2002

Print_ISBN

0-7908-0103-5

Type

conf

DOI

10.1109/GAAS.2002.1167928

Filename

1167928