DocumentCode :
2986163
Title :
Reliability evaluation on dual-etch-stop InGaAs PHEMTs
Author :
Gao, Frank
fYear :
2002
fDate :
20 Oct. 2002
Firstpage :
98
Lastpage :
116
Keywords :
Indium gallium arsenide; PHEMTs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
GaAs Reliability Workshop, 2002
Print_ISBN :
0-7908-0103-5
Type :
conf
DOI :
10.1109/GAAS.2002.1167928
Filename :
1167928
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2986163
