• DocumentCode
    2986447
  • Title

    Modeling phase and amplitude noise in heterojunction bipolar transistor amplifiers

  • Author

    Ferre-Pikal, Eva S. ; Luce, Matthew J. ; Asirvatham, Koby ; Sengupta, Saptarshi

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wyoming Univ., Laramie, WY, USA
  • fYear
    2004
  • fDate
    23-27 Aug. 2004
  • Firstpage
    734
  • Lastpage
    737
  • Abstract
    In this paper we present a numerical noise model for heterojunction bipolar transistor (HBT) amplifiers and use it to predict the phase modulation (PM) and amplitude modulation (AM) noise sensitivities to low-frequency current noise in linear microwave HBT amplifiers. The model predicts that at carrier frequencies close to the amplifier´s 3-dB frequency the AM noise sensitivity decreases with increasing current and with increasing carrier frequency. In addition, at these carrier frequencies the PM noise sensitivity does not show a simple dependence with current, but it varies with carrier frequency, and transistor and circuit parameters. Furthermore, at low carrier frequencies the PM noise sensitivity increases with increasing carrier frequency, at around the 3-dB frequency it reaches a maximum then it decreases with carrier frequency.
  • Keywords
    amplitude modulation; bipolar transistor circuits; circuit noise; microwave amplifiers; phase modulation; phase noise; AM noise; PM noise; amplitude modulation; amplitude noise; carrier frequency; heterojunction bipolar transistor amplifiers; linear microwave HBT amplifiers; low-frequency current noise; noise sensitivity; numerical noise model; phase modulation; phase noise; Circuit noise; Frequency; Heterojunction bipolar transistors; Low-frequency noise; Low-noise amplifiers; Microwave amplifiers; Noise level; Numerical models; Phase noise; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exposition, 2004. Proceedings of the 2004 IEEE International
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-8414-8
  • Type

    conf

  • DOI
    10.1109/FREQ.2004.1418556
  • Filename
    1418556