Title :
Designing to maximize flying prober effectiveness
Author_Institution :
Bull Electron, USA
Abstract :
Discusses flying prober capabilities and presents a DFT summary. Test coverage expectations are covered
Keywords :
design for testability; electronic equipment testing; probes; production testing; DFT summary; flying prober effectiveness; test coverage expectations; Design for testability; Testing;
Conference_Titel :
Electro/99 Technical program, 1999. Proceedings of the
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-5475-3
DOI :
10.1109/ELECTR.1999.779375
